Computer program TRACK_TEST for calculating parameters and plotting profiles for etch pits in nuclear track materials

Published: 15 January 2006| Version 1 | DOI: 10.17632/cv4jbb2ds6.1
Contributors:
D. Nikezic,
K. N. Yu

Description

Abstract A computer program called TRACK_TEST for calculating parameters (lengths of the major and minor axes) and plotting profiles in nuclear track materials resulted from light-ion irradiation and subsequent chemical etching is described. The programming steps are outlined, including calculations of alpha-particle ranges, determination of the distance along the particle trajectory penetrated by the chemical etchant, calculations of track coordinates, determination of the lengths of the major and mi... Title of program: Track_Test Catalogue Id: ADWT_v1_0 Nature of problem Fast heavy charged particles (like alpha particles and other light ions etc.) create latent tracks in some dielectric materials. After chemical etching in aqueous NaOH or KOH solutions, these tracks become visible under an optical microscope. The growth of a track is based on the simultaneous actions of the etchant on undamaged regions (with the bulk etch rate V b ) and along the particle track (with the track etch rate V t ). Growth of the track is described satisfactorily by these two paramete ... Versions of this program held in the CPC repository in Mendeley Data ADWT_v1_0; Track_Test; 10.1016/j.cpc.2005.09.011 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)

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