REX — a least-squares fitting program for the simulation and analysis of X-ray reflectivity data

Published: 1 January 1993| Version 1 | DOI: 10.17632/b5n8c8tzgh.1
T.A. Crabb, P.N. Gibson, K.J. Roberts


Abstract A FORTRAN program REX, which has been developed to facilitate the interpretation of X-ray reflectivity data, is described. The program allows the simulation of reflectivity profiles as a function of either incident angle or of energy. Factors such as anomalous dispersion, and surface and interface roughness are taken into account in the model. In addition, experimental data of reflectivity as a function of incident angle can be matched to user-supplied theoretical parameters by a least-square... Title of program: REX Catalogue Id: ACPI_v1_0 Nature of problem Interpretation of X-ray reflectivity spectra from thin films or multilayers. Versions of this program held in the CPC repository in Mendeley Data ACPI_v1_0; REX; 10.1016/0010-4655(93)90188-I This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)



Crystallography, Computational Physics